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		<id>https://en.formulasearchengine.com/index.php?title=Neural_cryptography&amp;diff=17678</id>
		<title>Neural cryptography</title>
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		<updated>2013-12-03T14:35:12Z</updated>

		<summary type="html">&lt;p&gt;83.202.202.242: /* References */&lt;/p&gt;
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&lt;div&gt;{{Refimprove|date=March 2008}}&lt;br /&gt;
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A definition in [[semiconductor physics]], &#039;&#039;&#039;carrier lifetime&#039;&#039;&#039; is defined as the average time it takes for a [[minority carrier]] to [[Carrier generation and recombination|recombine]].  The process through which this is done is typically known as &#039;&#039;&#039;minority carrier recombination&#039;&#039;&#039;.&lt;br /&gt;
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The energy released due to [[Carrier generation and recombination|recombination]] can be either thermal, thereby heating up the semiconductor (&#039;&#039;thermal recombination&#039;&#039; or [[non-radiative recombination]], one of the sources of [[waste heat]] in [[semiconductor]]s), or released as [[photon]]s (&#039;&#039;optical recombination&#039;&#039;, used in [[light-emitting diode|LEDs]] and [[semiconductor laser]]s).&lt;br /&gt;
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Carrier lifetime plays an important role in [[Bipolar junction transistor|bipolar transistors]] and [[solar cells]].&lt;br /&gt;
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In [[indirect band gap]] semiconductors, the carrier lifetime strongly depends on the concentration of recombination centers. Gold atoms act as highly efficient recombination centers, silicon for some high switching speed diodes and transistors is therefore alloyed with a small amount of gold. Many other atoms, e.g. iron or nickel, have similar effect.&amp;lt;ref&amp;gt;Alan Hastings - The Art of Analog Layout, 2nd ed (2005, ISBN 0131464108)&amp;lt;/ref&amp;gt;&lt;br /&gt;
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==Carrier lifetime in semiconductor lasers==&lt;br /&gt;
In semiconductor lasers, the carrier lifetime is the time it takes an electron before recombining via non-radiative processes in the laser cavity. In the frame of [[Laser diode rate equations|rate equations model]], carrier lifetime is used in the charge conservation equation as the time constant of the exponential decay of carriers.&lt;br /&gt;
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The dependence of carrier lifetime on the carrier density is expressed as:&amp;lt;ref&amp;gt;L.A. Coldren and S.W. Corzine, &amp;quot;Diode Lasers and Photonic Integrated Circuits&amp;quot;, Wiley Interscience, 1995&amp;lt;/ref&amp;gt;&lt;br /&gt;
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:&amp;lt;math&amp;gt;\frac{1}{\tau_n(N)}= A + BN + CN^2&amp;lt;/math&amp;gt;&lt;br /&gt;
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where A, B and C are the non-radiative, radiative and Auger recombination coefficients and &amp;lt;math&amp;gt;\tau_n(N)&amp;lt;/math&amp;gt; is the carrier lifetime.&lt;br /&gt;
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==References==&lt;br /&gt;
{{Reflist}}&lt;br /&gt;
&lt;br /&gt;
==External links==&lt;br /&gt;
{{Portal|Electronics}}&lt;br /&gt;
* [http://www.iue.tuwien.ac.at/phd/park/node32.html Carrier Lifetime]&lt;br /&gt;
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[[Category:Charge carriers]]&lt;/div&gt;</summary>
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