File:Silicon dislocation orientation 100 mag 500x.png
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Silicon_dislocation_orientation_100_mag_500x.png (768 × 576 pixels, file size: 658 KB, MIME type: image/png)
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Date/Time | Thumbnail | Dimensions | User | Comment | |
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current | 02:12, 13 September 2005 | 768 × 576 (658 KB) | wikimediacommons>Twisp | * Title: Dislocations in Si crystal, orientation 100 * Desc: Image of dislocations in Si crystal made using interference microscope with 500x magnification. Crystal orientation can be determined by the elliptical shape of dislocations. * Author: Twisp * D |
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